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Electron Backscatter Diffraction (EBSD)



EDAX’s TEAM™ EBSD Analysis System is the most comprehensive system available for analyzing crystalline microstructures. The solution obtains crystallographic orientation, grain-boundary character, and phase-distribution information from single and polyphase crystalline materials through the collection and analysis of Electron Backscatter Diffraction (EBSD) patterns in a scanning electron microscope (SEM). TEAM™ EBSD Analysis System combines the ease of use of the TEAM™ software platform with the analytical power of OIM™ to provide state of the art crystal structure characterization to all users.

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TEAM™ EBSD Analysis System
EDAX’s TEAM™ EBSD Analysis System is the most comprehensive system available for analyzing crystalline microstructures. The solution obtains crystallographic orientation, grain-boundary character, and phase-distribution information from single and polyphase crystalline materials through the collection and analysis of Electron Backscatter Diffraction (EBSD) patterns in a scanning electron microscope (SEM). TEAM™ EBSD Analysis System combines the ease of use of the TEAM™ software platform with the analytical power of OIM™ to provide state of the art crystal structure characterization to all users.

Hikari XP EBSD Camera
EDAX’s high-speed and high-sensitivity Hikari XP is the next generation in EBSD cameras offering outstanding performance across the complete range of EBSD applications. With Hikari XP, users no longer need to decide between speed and sensitivity. Hikari XP collects data at high speed when throughput is essential and performs at the same high indexing rates under challenging nano-analysis conditions. Hikari XP can achieve simultaneous acquisition and indexing speeds up to 1,000 indexed points per second for efficient SEM use.

DigiView EBSD Camera
EDAX's DigiView is a versatile high resolution digital camera. The CCD sensor has a particularly high Quantum Efficiency (QE), peaking in the blue-green spectrum for use with an optimized phosphor screen coating resulting in higher sensitivity for EBSD applications.

Forward Scatter Detector (FSD)
The FSD is an ideal analytical tool for previewing the microstructure to select a region for EBSD data collection and for qualitatively inspecting the microstructure to characterize deformation and strain gradients critical to materials design.